CCD image sensors are the core imaging components in fields such as aerospace remote sensing, precise imaging, industrial inspection, security detection, and scientific research microscopy. The performance of the sensor, including its photoelectric conversion accuracy, imaging uniformity, noise level, and charge transfer capability, directly determines the imaging clarity, dynamic range, and detection stability of the entire system. Traditional testing equipment has limited parameters, low calibration accuracy, and low automation level. It cannot simultaneously cover multiple core photoelectric parameter tests and is difficult to accurately screen hidden defects such as dark current, invalid pixels, and signal attenuation. It cannot meet the high-precision quality inspection, new product development, and irradiation aging testing requirements for military aerospace and high-end industrial CCD devices, thus restricting the technological iteration and quality upgrade of high-end imaging devices.
Based on the precision photoelectric testing field, Saifan Optoelectronics relies on precise light source calibration, high-precision data acquisition, and intelligent algorithm analysis technologies to launch the CCD photoelectric performance measurement system. It integrates multi-parameter integrated testing, precise light source calibration, high signal-to-noise ratio acquisition, and automatic data analysis, completing the full-dimensional photoelectric performance calibration and defect screening of CCD devices in one step, providing a standardized, traceable, and high-precision complete set of testing solutions for device research and modification, process optimization, mass production quality inspection, and irradiation performance evaluation.
Thirteen full-parameter synchronous tests, covering all core performance of CCD
Different from the limitations of traditional equipment's single-parameter scattered testing, this system can complete 13 CCD core photoelectric parameter synchronous tests at once, comprehensively covering the static and dynamic performance indicators of the device. Precise tests of saturation output voltage, dark noise, dark current, charge transfer efficiency (CTE), spectral response sensitivity, modulation transfer function (MTF), dynamic range, face response non-uniformity, invalid pixels, equivalent noise illuminance, etc., fully restore the real working performance of the CCD device, without test blind spots or parameter omissions.
It can accurately capture hidden problems such as production process defects, pixel response deviation, charge transfer loss, abnormal dark state noise, etc., and accurately evaluate the performance attenuation laws of the device under normal working conditions and irradiation environments, perfectly adapting to the full-dimensional performance calibration requirements of conventional civilian CCD, industrial-grade area array CCD, and aerospace-military-grade special CCD.
High-precision light source calibration, traceable test benchmark
The system is equipped with a high-precision integrating sphere uniform light source and multi-band calibration light source architecture, combined with an independent controllable dimming module, with excellent light field uniformity and stable controllable illumination, capable of achieving wide-range precise dimming, eliminating test errors caused by light source fluctuations from the source. It adopts the single-path direct comparison calibration method and standard detector traceability calibration, with precise wavelength matching the response wavelength band of the CCD device, perfectly adapting to the testing of different specifications and response characteristics of CCD chips and imaging devices.
The overall testing accuracy is strict and reliable, with an absolute measurement uncertainty lower than 8%, and a repeatability error of ≤ 3%. It is equipped with a 14-bit ultra-high A/D quantization acquisition level, significantly improving the signal acquisition signal-to-noise ratio, effectively avoiding interference from stray light, signal distortion, and data drift, and the test data is accurate and traceable, fully meeting the precision standards for high-end research, military projects, and strict quality inspection in the industrial sector.
Fully automatic intelligent detection, efficient adaptation to R&D and mass production scenarios
Abandoning the cumbersome manual dimming, parameter-by-parameter testing, and manual calculation processes of traditional CCD testing, the system is equipped with dedicated intelligent control software, achieving one-click automatic detection, parameter synchronous acquisition, data linkage analysis, defect automatic determination, and report generation in one click. It supports custom test conditions, integration time, dimming gradient, test area, etc., and can be adapted to the testing needs of different forms of samples such as wafer wafers, packaged products, and array devices.
The equipment supports static steady-state testing and dynamic continuous monitoring, capable of tracking the performance attenuation changes of CCD devices over a long period of time and accurately analyzing the stability and reliability of the device. The operation threshold is low and the automation level is high. High-precision tests can be completed without professional debugging experience. It is suitable for both laboratory new product development and mechanism research, as well as frequent testing scenarios such as batch production quality control, component screening, and process benchmarking for enterprises.
Compatible with multiple scenarios, covering the testing of all imaging devices in various fields.
The system is compatible with all types of CCD imaging device testing and is widely used in aerospace remote sensing, aviation detection, military imaging, industrial visual inspection, precision microscopic imaging, security monitoring, civilian photo imaging, and other diversified fields. It can accurately complete performance calibration for conventional area array/line array CCD, low-light CCD, radiation-resistant special CCD, and high dynamic imaging CCD. It also supports component aging tests, radiation hardening performance evaluations, and adaptability tests in high and low temperature environments. It comprehensively covers the entire process of basic research, process optimization, reliability verification, and mass production quality control.
The entire testing adopts a non-destructive detection mode, without damaging the device structure and imaging performance. It can be used for repeated sample testing and dynamic monitoring of device performance changes, providing precise assistance for enterprises to optimize packaging processes, screen high-quality components, and improve product imaging quality.
Modular expansion design, suitable for high-end customized research needs.
The system adopts an open modular architecture, supporting flexible function upgrades and personalized customization. It can fully match high-level research and industrial testing needs. It can expand a wide-spectrum light source module to adapt to the testing of special-band response CCD devices; it can be combined with a high and low temperature environment module to achieve dynamic performance testing in a wide temperature range, exploring the impact of temperature on CCD imaging performance and photoelectric conversion efficiency; it can be linked with irradiation test components to simulate space irradiation environments and complete aerospace-grade device anti-irradiation performance evaluations, meeting the customized testing needs of high-end special devices.
Domestic high-quality products replace imported ones, and high cost performance enables industrial upgrading.
Compared with imported high-end CCD photoelectric testing equipment, Sefan Optoelectronics relies on its independent R&D and local production advantages. Its core light source system, acquisition module, and measurement control algorithm are fully independently controllable. The overall testing accuracy, stability, and parameter completeness fully match the international first-level standards. At the same time, it completely solves the problems of high import equipment prices, long delivery cycles, delayed after-sales response, difficult customization and modification, and high maintenance costs. It has the core advantages of full parameter testing, high precision, high stability, easy operation, short delivery time, and full technical support.
The manufacturer provides on-site installation and commissioning, professional technical training, lifetime maintenance, and one-stop customized services. This significantly reduces the equipment procurement and maintenance costs for research institutions, military units, and photoelectric enterprises, helping to replace imported high-end imaging device testing equipment domestically and enabling technological iteration and quality upgrade in the photoelectric imaging industry.
Precise calibration of the imaging core, laying a solid foundation for device quality
High-quality imaging results stem from the precise controllability of each photoelectric parameter of the device. The CCD photoelectric performance measurement system of Sefan Optoelectronics, with its thirteen full-parameter integrated testing capabilities, traceable high-precision calibration, intelligent and efficient detection experience, and expandable modular design, quantifies the photoelectric performance of CCD devices, accurately screens hidden defects, and provides a stable and reliable testing foundation for imaging device research and innovation, process optimization, and precise quality control, continuously empowering high-quality development in the high-end photoelectric imaging field.
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