Optical detectors are the core cornerstone components in fields such as optical communication, infrared imaging, photovoltaic new energy, precise sensing, aerospace remote sensing, etc. The key parameters of detectors, including spectral response sensitivity, quantum efficiency, response speed, and dark current, directly determine the detection accuracy, signal-to-noise ratio, and operational stability of the equipment. Throughout the entire process of device research and development, sample calibration, mass production quality inspection, and performance iteration, precise, all-encompassing, and traceable spectral response testing is the core key to controlling device quality and breaking through performance bottlenecks. Traditional testing equipment has limitations in wavelength range, insufficient accuracy, cumbersome operation, and large data deviations, making it difficult to meet the high-precision testing requirements of new micro-nano detectors, infrared devices, and photovoltaic cells. This severely restricts the technological iteration of the photonic industry.
After years of deep research in the field of precise photonic testing, Sevan Optoelectronics, relying on mature optical design, precise measurement control, and weak signal acquisition technologies, has launched the 7-DRSpec detector spectral response testing system. With ultra-wide spectral coverage, nanometer-level high-precision scanning, dual-mode testing architecture, and modular expansion design, it solves all the problems of spectral performance detection for various photonic detectors in one step, providing a standardized, high-precision, and intelligent complete testing solution for scientific research experiments, new product development, and industrial mass production calibration.
Ultra-wide full-spectrum coverage, unlocking the testing capabilities for multiple types of devices
Different from the single-band testing limitations of traditional equipment, this system achieves ultra-wide spectral coverage from 200nm to 2500nm in deep ultraviolet-visible-near-infrared, perfectly adapting to the testing of all types of photonic detector devices. Whether it is deep ultraviolet day-blind detectors, visible light CMOS/CCD image sensors, photovoltaic cells, or near-infrared fiber optic sensing detectors, mid-to-long infrared thermal imaging detectors, quantum dot micro-nano devices, all can achieve precise detection of the full-spectrum response, covering the mainstream application bands of research and industrial applications.
The system is equipped with a deuterium lamp + tungsten lamp combined light source combination, combined with a high-precision voltage stabilizing power supply module, with the current output of the light source drifts low to 0.04%/h, and the spectral energy is stable and without fluctuations during long-term testing, avoiding data errors caused by light source deviations from the source. It innovatively adopts a three-grating monochromator + six-step filter wheel collaborative architecture, combined with precise step-by-step subdivision transmission technology, with the minimum motor step distance reaching 0.005nm, which can effectively eliminate multi-level spectral stray light interference, with a spectral bandwidth of 0.2–10nm that can be adjusted, purifying the testing optical path to the utmost, and ensuring spectral purity and testing accuracy.
Dual testing modes compatible, suitable for all scenarios of different-sized detectors
To address the testing pain points of different-sized and different-structured detectors, the system innovatively adopts the illumination method + flux method dual testing modes, taking into account the testing needs of micro-nano small-sized devices and large-area devices, with no blind spots in the applicable scenarios. For quantum dot detectors with an effective area of less than 1mm² and nanowire micro-nano devices, the integral sphere illumination method is used for testing, with a light spot uniformity of better than 1%, combined with high-precision micro-positioning and precise displacement platforms, achieving precise alignment of 40μm-level small light spots, perfectly solving the problems of uneven light spots, positioning deviations, and large testing errors of micro-nano devices.
For photovoltaic cells with an effective area of more than 1cm² and large-area detection panels and other devices, the total reflection flux method imaging optical path is adopted, effectively avoiding the chromatic defect of the transmission optical path, with an optical utilization rate significantly improved by 30%, and the system signal-to-noise ratio can reach above 1000:1, ensuring stable and reliable testing data with extremely strong repeatability, capable of accurately capturing the subtle performance differences of devices, and meeting the strict precision requirements of mass production quality inspection.
Intelligent fully automatic testing, one-click complete multi-dimensional data analysis
Abandoning the cumbersome manual debugging and step-by-step testing mode of traditional equipment, the 7-DRSpec system is equipped with an intelligent one-click testing control system, completing spectral scanning, data collection, parameter calculation, and report generation automatically throughout the process. Users only need to set basic parameters such as wavelength range, scanning step size, bias voltage, etc. The system can automatically complete the entire process of testing. Based on the principle of standard detector substitution, it can accurately output absolute spectral irradiance response sensitivity data. It also has a built-in professional algorithm to real-time derive the quantum efficiency curve. At the same time, it can complete multi-dimensional parameter analysis such as response time, dark current, and normalized detection rate.
The entire system is simple to operate and has a very low threshold. No professional optical path debugging experience is required to achieve high-precision testing. The entire process runs without human intervention, effectively avoiding human operation errors, significantly improving testing efficiency, and is suitable for different working scenarios such as laboratory high-frequency scientific research testing, enterprise batch production inspection, etc. It truly realizes one-time setup, fully automatic testing, and standardized report generation.
Modular and elastic expansion, suitable for high-level scientific research customization needs
The system adopts an open modular architecture, supports flexible selection and expansion of functions, and can be customized and upgraded according to high-level scientific research needs, adapting to diverse frontier research scenarios. It can be equipped with a variable temperature testing module to achieve wide temperature range testing from -196℃ liquid nitrogen low temperature to 300℃ high temperature, accurately analyzing the impact of temperature changes on detector performance, and helping to optimize the packaging process of infrared detectors and special optoelectronic devices.
It can also be equipped with a high-precision bias voltage scanning module, supporting a wide voltage range of 200μV - 505V and a large current range of 20fA - 200mA for dynamic scanning, accurately calculating the impact of bias voltage on detector sensitivity and gain, and suitable for APD avalanche diodes and special photo-sensitive devices for performance calibration. At the same time, it is compatible with various types of light sources such as lasers, LEDs, and xenon lamps, which can simulate complex lighting environments, accurately reproducing the actual performance of the device, and meeting the personalized testing needs of frontier research.
A benchmark of domestic precision craftsmanship, high cost-effectiveness empowering industrial upgrading
Compared with imported similar high-end testing equipment, the 7-DRSpec spectral response testing system of Saifan Optoelectronics, relying on its own independent research and development and local production advantages, has the five core advantages of high precision, high stability, high cost-effectiveness, easy expansion, and fast after-sales service. The equipment has undergone multi-dimensional precision calibration and stability detection before leaving the factory, with wavelength accuracy up to ±0.2nm and wavelength repeatability ±0.1nm. The core testing accuracy is benchmarked against international first-class standards, and can completely replace imported equipment.
At the same time, it avoids the pain points of high prices, long delivery cycles, delayed after-sales response, and difficult customization and modification of imported equipment, providing on-site installation and commissioning, technical training, lifetime maintenance, and one-stop customized services, significantly reducing the equipment procurement and usage costs of photonic enterprises and research institutions, and helping to upgrade and innovate domestic technology in the field of photonic detector devices.
Precise calibration of performance, empowering photonic innovation
From the research and development of basic scientific research devices, material performance analysis, to industrial production quality inspection and device process optimization, precise spectral response testing is the core strength of photonic technology iteration. The 7-DRSpec detector spectral response testing system of Saifan Optoelectronics, with its full-spectrum coverage testing capability, nanometer-level precise accuracy, intelligent operation experience, and expandable modular design, builds a performance benchmark for the photonic detector industry, helping each technological breakthrough and each device upgrade, and promoting the high-quality and continuous development of the photonic detection field.
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