In the waves of semiconductor material research and development, optoelectronic device optimization
and breakthroughs in new energy technologies, Photoluminescence (PL) spectral analysis has become
a core technology for revealing the band structure, defect distribution and luminescence performance
of materials. With 20 years of technological accumulation, Beijing Saifan Optoelectronic Instrument Co., Ltd.
has launched the 7-PLSpec photoluminescence spectroscopy testing system. With full-band coverage,
high-precision detection and modular design, it provides one-stop spectral analysis solutions for scientific
research and industrial users.
I. Technological Breakthrough: Full coverage from ultraviolet to near-infrared
The 7-PLSpec series breaks through the wavelength limitations of traditional spectrometers, achieving
an ultra-wide spectral range of 200-2500nm and supporting multi-band laser excitation in ultraviolet
(224nm, 248nm, 266nm), visible (488nm, 532nm), and near-infrared (946nm, 1946nm). The system adopts
an asymmetric C-T optical path design and is combined with a high signal-to-noise ratio monochromator,
which can effectively suppress stray light interference and ensure that the water Raman signal-to-noise
ratio is > 2000:1 (under 350nm excitation), meeting the testing requirements of various materials ranging
from Gan-based leds to perovskite solar cells.
Its ±0.2nm wavelength accuracy and ±0.1nm spectral resolution can precisely capture the minute offshifts
of the material's luminescence peak positions. For example, in the PL test of ZnO nanowire arrays, the system
can clearly distinguish the free exciton recombination peak (380nm) from the defect state luminescence
peak (520nm), providing key data for defect engineering research.
Ii. Scenario-based Innovation: Full-process support from room temperature to low temperature
For different application scenarios, 7-PLSpec offers three major models:
7-PLSpec I room-temperature scanning type: It is suitable for the basic luminescence property research
of materials such as semiconductor films and quantum dots, and supports compatibility testing of
solid/liquid/powder samples.
7-PLSpec II low-temperature scanning type: Equipped with a liquid nitrogen variable temperature accessory
(-196℃ to 300℃), it can study the influence of temperature on the carrier recombination dynamics of quantum
Wells, such as the blue shift phenomenon of the excon peak position in the low-temperature PL spectrum of
InGaN/GaN quantum Wells.
7-PLSpec Mini spectrometric type: Specifically designed for devices such as LED chips and laser diodes,
it can quickly calculate parameters such as peak wavelength and half-width, increasing the testing efficiency
by more than three times.
Iii. Intelligent Interaction: A closed-loop Experience from data collection to Report Generation
The system is equipped with self-developed intelligent testing software, supporting one-click parameter
setting and automated testing processes. Users can monitor the spectral curve in real time through the
10.1-inch touch screen. The software automatically generates a detailed report including spectral graphs,
data tables and analysis conclusions. For instance, in the study of defect states in perovskite solar cells,
the system can simultaneously output key parameters such as bandgap energy and defect density, and
supports data export in CSV/BMP format, seamlessly integrating with analysis tools like Origin and MATLAB.
Iv. Modular Architecture: Elastic Expansion of Future Demands
7-PLSpec adopts an open modular design, allowing users to flexibly select and configure functional modules
according to their needs:
Integrating sphere module: Enhances the test effect of diffuse reflection spectroscopy and is suitable for
PL characterization of high-scattering materials (such as silicon-based photovoltaic textured structures).
Microscopic module: Integrating microscopic objective lenses and piezoelectric positioning platforms, it
achieves PL imaging in micro-regions (< 1μm), facilitating the interface research of two-dimensional material
heterojunctions.
Transmission/reflection spectroscopy accessories: The combined testing of PL and transmission/reflection
spectroscopy is achieved through optical path switching, providing multi-dimensional data for the analysis
of the loss mechanism of optical films.
V. Industry Practice: Value Realization from the Laboratory to the Production Line
In the photovoltaic field, 7-PLSpec has been applied to the quality inspection of the Poly-Si passivation
layer of TOPCon cells, and the process defect areas can be quickly located through the PL intensity distribution
map. In the semiconductor industry, the system provides quantitative standards for the defect density
assessment of SiC epitaxial wafers, helping to increase the yield of 6-inch wafers to over 98%. In addition,
the system also serves the development of fluorescent probes in the biomedical field, achieving nanosecond-level
fluorescence lifetime measurement through time-resolved PL technology.
Conclusion: Define new standards for spectral testing through innovation
The 7-PLSpec photoluminescence spectroscopy testing system of SOFN Instruments is not only a
precision instrument but also a "digital microscope" for materials science research. Its full-band coverage,
high-sensitivity detection and modular expansion capabilities provide reliable technical support for innovative
breakthroughs in fields such as semiconductors, new energy and biomedicine. Choosing 7-PLSpec means
choosing the precise analytical capabilities that keep pace with the global scientific research frontier.
Consult immediately
Beijing SOFN Instruments Co., LTD
National Service Hotline: 010-80885970
Official website: http://www.7-s.com.cn
Wechat official Account: Saifan Optoelectronic Instruments
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